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Instruments by Function


ImagingÌýprovides surface spatial information. This could be morphological as in the case of scanning probe microscopy or chemical as in the case of Raman microscopy.

Elemental analysisÌýprovides information about the various elements present in a sample as in the case of laser ablation mass spectrometry and in some cases the oxidation state as in the case of x-ray photoelectron spectroscopy.

IdentificationÌýof a material often requires information about atomic arrangement as in the case of x-ray diffraction or chemical bonding as in the case of infrared or nuclear magnetic resonance spectroscopy.

Thin film & nanoparticle characterizationÌýcan provide information of thickness and size. For example, dynamic light scattering will provide average particle size of particles in a suspension and ellipsometry can provide film thickness and dielectric constant.

Structural informationÌýcan be obtained ranging from ordering at the atomic level with standard x-ray diffraction up to larger-scale molecular structures with wide angle x-ray diffraction.

Bulk propertiesÌýof materials can be obtain including magnetic properties, dielectric constant, conductivity and hardness.

IMAGING

Electron Microscopy

Hitachi S-4700 FE Scanning Electron Microscope
Comments:
ÌýMagnifications up to approx 500,000x, secondary and back-scattered electron image formation, X-ray spectra/mapping (EDS, for Z > 5), digital image acquisition, coating units (gold and carbon).
Contact:ÌýDr. Eric Moreau, Mechanical Engineering

JEOL JXA-8200 Electron Probe Micro-Analyzer
Contact:ÌýD. J. MacDonald, Robert M. MacKay Electron Microprobe Lab, Earth Sciences

ZEISS/LEO 1455vp Variable PressureÌýScanning Electron Microscope
Comments:
Ìýlarge specimen chamber
Contact:ÌýDr. Ping Li,ÌýScientific Imaging Suite,ÌýDepartment of Biology

FEI, Tecnai 12 Transmission Electron Microscope
Comments:Ìý
120 kv; 300 kx; Gatan 832 SC1000 11M pixels (4008 x 2672) CCD cameraÌý
Contact:ÌýDr. Ping Li,ÌýScientific Imaging Suite,ÌýDepartment of Biology

Optical Microscopy

Optical Microscope
Comments:
Ìýup to 1000x, bright/dark field, polarized light, interference contrast, Nemarski contrast, oil immersion lenses, Polaroid, 35 mm and digital image acquisition (black and white).
Contact:ÌýDr. Kevin Plucknett, Mechanical Engineering

Keyence VK-X1000 - 3D Confocal Laser Scanning Microscope (CLSM) Ìý
Comments:
Non-contact profile, roughness and film thickness measurements, nanometer resolution, material and shape independent. Fully automatic measurement and analysis.
Contact:ÌýDr. Eric Moreau, Mechanical Engineering

LSM-410-Carl Zeiss Confocal laser scanning microscope
Comments: ; fluorescence (3 laser lines: 488nm, 568nm, 647nm), optical sectioning, digital imaging, 3D reconstruction, inverted microscope
Contact:ÌýDr. Ping Li,ÌýScientific Imaging Suite, Department of Biology

Other

Bruker Bioscope Catalyst Atomic Force Microscope with Horiba Raman Spectrometer
Comments:Ìý
100 microns XY scanner; 22 microns Z-range.
Contact:ÌýDr. Laurent Kreplak, Physics & Atmospheric Science

ELEMENTAL ANALYSIS

Hitachi S-4700 FE Scanning Electron Microscope
Comments:
ÌýMagnifications up to approx 30,000x, secondary and back-scattered electron image formation, X-ray spectra/mapping (EDS, for Z > 5), Polaroid and digital image acquisition, coating units (gold and carbon).
Contact:ÌýDr. Eric Moreau, Mechanical Engineering

JEOL JXA-8200 Electron Probe Micro-Analyzer
Contact:ÌýD. J. MacDonald, Robert M. MacKay Electron Microprobe Lab, Earth Sciences

VG Microtech MultiLab ESCA 2000 X-ray Photoelectron Spectrometer (XPS)
Contact:ÌýAndrew George, Physics and Atmospheric Science

Bruker Compact QTOF Mass Spectrometer
Comments:
Ìým/z range of 20-39000; ESI, APCI, APPI, Solid probe and Captive spray sources.
Contact:ÌýXiao Feng,ÌýMass Spectrometry Laboratory, Chemistry

IDENTIFICATION

Nicolet NXR 9650 FT-Raman spectrometer
Comment:ÌýNd: YVO4Ìý1064 nm laser; spectral range: 4000 cm-1Ìýto 50 cm-1;Ìývariable temperature cell (-150 to 150 °C);Ìýdepolarization accessory.
Contact:ÌýMike Johnson

VG Microtech MultiLab ESCA 2000 X-ray Photoelectron Spectrometer (XPS)
Contact:ÌýAndrew George, Physics and Atmospheric Science

BrukerÌýAV-III 700 MHz NMR spectrometer
Comments:Ìý; multi-nuclear NMR for solids, range from 87Sr -31P, H/F, for 2.5mm, 3.2mm and 4mm rotors with dual and triple resonance MAS probe heads.Ìý
Contact:ÌýDr. Ulrike Werner-Zwanziger,Ìý), Chemistry

Bruker Avance DSX 400 NMR spectrometer
Comments:
Ìý; multi-nuclear NMR for solids, range from 15N -31P, H/F, for 2.5mm, 4mm and 7mm rotors with dual and triple resonance MAS probe heads, and wideline capabilities.
Contact:ÌýDr. Ulrike Werner-Zwanziger,Ìý),ÌýChemistry

Bruker AV 300 NMR spectrometer
Comments:
Ìý;Ìýmultinuclear NMR of liquids.
Contact:ÌýDr. Mike Lumsden,Ìý),ÌýChemistry

Bruker AV 500 NMR spectrometer
Comments:
Ìý; multinuclearÌýNMR of liquids.
Contact:
ÌýDr. Mike Lumsden,Ìý),ÌýChemistry

Bruker micTOF Mass spectrometer
Comments:
ÌýAPCI/MS, ESI/MS,ÌýLC/MS with either APCI or ESI,Ìýand high-resolution ESI or APCI, accurate mass determination.Ìý
Contact:ÌýXiao Feng,ÌýMass Spectrometry Laboratory, Chemistry

Bruker Compact QTOF Mass Spectrometer
Comments:
Ìým/z range of 20-39000; ESI, APCI, APPI, Solid probe and Captive spray sources.
Contact:ÌýXiao Feng,ÌýMass Spectrometry Laboratory, Chemistry

VG/Micromass Quattro Mass spectrometer
Comments:
Ìýtriple quadrupole mass spectrometer; EI/MS, CI/MS, APCI/MS, ESI/MS, GC/MS with either EI or CI, LC/MS with either APCI or ESI, MS/MS.
Contact:ÌýXiao Feng,ÌýMass Spectrometry Laboratory, Chemistry

AB SCIEX API 2000 QTRAP Mass Spectrometer
Comments
:Ìýtriple quadrupole;Ìý
Contact:ÌýXiao Feng,ÌýMass Spectrometry Laboratory, Chemistry

Thermo Finnigan LCQ Duo Mass spectrometer
Comments:
ÌýIon Trap mass spectrometer; APCI/MS, ESI/MS, flow injection MS with either APCI or ESI, LC/MS with either APCI or ESI, MS/MS.
Contact:ÌýXiao Feng,ÌýMass Spectrometry Laboratory, Chemistry

THIN FILM & NANOCHARACTERIZATION

VG Microtech MultiLab ESCA 2000 X-ray Photoelectron Spectrometer (XPS)
Contact:ÌýAndrew George, Physics and Atmospheric Science

STRUCTURAL INFORMATION

Bruker D8 Advance High Speed X-ray Diffractometer
Comments:
ÌýÌý[PDF - 128kB]
Contact:ÌýDr. Zoheir Farhat, Mechanical Engineering

Siemens D500 Powder X-ray Diffractometer
Comments:
Ìýstructural analysis of powdered samples (4K to room temperature).
Contact:ÌýAndy George, Physics & Atmospheric Science

Powder x-ray diffraction and JCPDS datafile
Contact:
ÌýDr. Jeff Dahn, Physics & Atmospheric Science

BrukerÌýAvance 700 MHz NMR spectrometer
Comments:Ìý; multi-nuclear NMR for solids, range from 87Sr -31P, H/F, for 2.5mm, 3.2mm and 4mm rotors with dual and triple resonance MAS probe heads.Ìý
Contact:ÌýDr. Ulrike Werner-Zwanziger,Ìý), Chemistry

Bruker Avance DSX 400 NMR spectrometer
Comments:
Ìý; multi-nuclear NMR for solids, range from 15N -31P, H/F, for 2.5mm, 4mm and 7mm rotors with dual and triple resonance MAS probe heads, and wideline capabilities.
Contact:ÌýDr. Ulrike Werner-Zwanziger,Ìý),ÌýChemistry

Bruker AV 300 NMR spectrometer
Comments:
Ìý;Ìýmultinuclear NMR of liquids.
Contact:ÌýDr. Mike Lumsden,Ìý),ÌýChemistry

Bruker AV 500 NMR spectrometer
Comments:
ÌýmultinuclearÌýNMR of liquids.
Contact:
ÌýDr. Mike Lumsden,Ìý),ÌýChemistry

Bruker AV-III 700 MHz spectrometer
Comments:Ìý5 mm and 1.7 mm TCI cryoprobes
Contact:ÌýDr. Mike Lumsden,Ìý),ÌýChemistry

BULK PROPERTIES

JD Lemmens Grindosonic
Comments:Ìýmeasures the elastic propoerties of a wide range of materials
Contact:ÌýDr. Farid Taheri, Mechanical Engineering

Bruker D8 Advance High Speed X-ray Diffractometer
Comments:
ÌýÌý[PDF - 128kB]
Contact:ÌýDr. Zoheir Farhat, Mechanical Engineering

Siemens D500 Powder X-ray Diffractometer
Comments:
Ìýstructural analysis of powdered samples (4K to room temperature).
Contact:ÌýAndy George, Physics & Atmospheric Science

Powder x-ray diffraction and JCPDS datafile
Contact:
ÌýDr. Jeff Dahn, Physics & Atmospheric Science

TA Instrument Q200ÌýDifferential Scanning Calorimeter
Comments:ÌýTemperature range of -170ËšC to 500ËšC
Contact:ÌýMike Johnson

Netzsch LFA 427 High Temperature Laser Flash Thermal Diffusivity Apparatus
Contact:ÌýDr.ÌýStephen Corbin,ÌýMechanical Engineering

BrukerÌýAvance 700 MHz NMR spectrometer
Comments:Ìý; multi-nuclear NMR for solids, range from 87Sr -31P, H/F, for 2.5mm, 3.2mm and 4mm rotors with dual and triple resonance MAS probe heads.Ìý
Contact:ÌýDr. Ulrike Werner-Zwanziger,Ìý), Chemistry

Bruker Avance DSX 400 NMR spectrometer
Comments:
multi-nuclear NMR for solids, range from 15N -31P, H/F, for 2.5mm, 4mm and 7mm rotors with dual and triple resonance MAS probe heads, and wideline capabilities.
Contact:ÌýDr. Ulrike Werner-Zwanziger,Ìý),ÌýChemistry

Netzsch 404 F1 Pegasus Differential Scanning Calorimeter
Comments:
ÌýPt furnace (RT to 1500°C), Turbomolecular vacuum pump + high purity inert gasses
Contact:ÌýDr. Eric Moreau, Mechanical Engineering

Netzsch 427 Laser Flash Apparatus
Comments:SiC furnace (RT to 1550 °C), Turbomolecular vacuum pump + high purity inert gasses. Full melting capabilities.
Contact:ÌýDr. Eric Moreau, Mechanical EngineeringÌý

Netzsch STA 449 F1 Simultaneous Thermal Analyser (Differential Scanning Calorimetry + Thermogravimetric Analysis) with GCMS
Comments:
ÌýSiC furnace RT to 1550 C and Silver furnace -120 to 675 C. In-line Agilent technologies 7820A gas chromatography + 5975 mass spectrometer for evolved gas analysis.Ìý Contact:ÌýDr. Eric Moreau, Mechanical EngineeringÌý

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